News December 20, 2021
Arm Fellow Teresa McLaurin Receives Rising Women of Influence Award from Global Semiconductor Alliance
McLaurin’s role as the senior director of design for test architecture has influenced the testability of billions of chips.
- Rising Women of Influence Award recognizes the next generation of women leaders in the semiconductor industry
- McLaurin was the first female Fellow in Arm and had previously received the Bob Madge Innovation Award for her work in Design for Test
- McLaurin’s role as the senior director of design for test architecture has influenced the testability of billions of chips
San Jose, CA, USA – The Global Semiconductor Alliance has recognized Teresa McLaurin, Fellow and senior director of design for test (DFT) architecture at Arm, as its Rising Women of Influence Award winner for 2021. The award, announced at the GSA Awards Virtual Ceremony celebration, recognizes McLaurin as part of the next generation of semiconductor industry leaders.
“Teresa’s impact and leadership in advancing the art of testing and verification can be felt across the semiconductor industry,” said Simon Segars, CEO, Arm. “I’m delighted to see her recognized for this distinguished award.”
McLaurin has the distinction of being the first female Fellow in Arm and has previously been recognized for her work in DFT as a Bob Madge Innovation Award recipient by IEEE. Her decades of contributions and leadership have influenced the testability of billions of chips manufactured into the world. Currently McLaurin leads the global design for test initiatives of Arm IP used by all of Arm’s partners, with their myriad of methodologies and workflows. She is based in Austin, TX and is passionate about helping other women move forward in their roles.
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Corporate Public Relations Manager, Arm
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